Scanning kelvin force microscopy for characterizing nanostructures in atmosphere

JJ Kopanski, MY Afridi - AIP Conference Proceedings, 2007 - pubs.aip.org
The Electrostatic Force Microscope (EFM) and the related Scanning Kelvin Force
Microscope (SKFM) are of interest for the measurement of potential distributions within …
被引用次数：9 相关文章
[PDF] nist.gov

[PDF][PDF] Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

JJ Kopanski, MY Afridi, S Jeliazkov, W Jiang… - tsapps.nist.gov
The Electrostatic Force Microscope (EFM) and the related Scanning Kelvin Force
Microscope (SKFM) are of interest for the measurement of potential distributions within …

Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

J Kopanski, M Afridi, S Jeliazkov, W Jiang, TR Walker - 2007 - nist.gov
Abstract The Electrostatic Force Microscope (EFM) and its variants are of interest for the
measurement of potential distributions within nanostructures, and for work function …

Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

JJ Kopanski, MY Afridi, S Jeliazkov… - … and Metrology for …, 2007 - ui.adsabs.harvard.edu
Abstract The Electrostatic Force Microscope (EFM) and the related Scanning Kelvin Force
Microscope (SKFM) are of interest for the measurement of potential distributions within …

[引用][C] Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

JJ Kopanski, MY Afridi, S Jeliazkov, W Jiang… - AIP Conference …, 2007 - cir.nii.ac.jp
Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere | CiNii
Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 …
[PDF] archive.org

[PDF][PDF] Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

JJ Kopanski, MY Afridi, S Jeliazkov, W Jiang… - scholar.archive.org
The Electrostatic Force Microscope (EFM) and the related Scanning Kelvin Force
Microscope (SKFM) are of interest for the measurement of potential distributions within …

Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

JJ Kopanski, MY Afridi, S Jeliazkov, W Jiang… - AIP Conference …, 2007 - pubs.aip.org
The Electrostatic Force Microscope (EFM) and the related Scanning Kelvin Force
Microscope (SKFM) are of interest for the measurement of potential distributions within …

Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

J Kopanski, M Afridi, S Jeliazkov, W Jiang, TR Walker - 2007 - nist.gov
Abstract The Electrostatic Force Microscope (EFM) and its variants are of interest for the
measurement of potential distributions within nanostructures, and for work function …