been probed with normal incidence X-ray standing wavefield absorption (NIXSW) and near
edge X-ray absorption fine structure (NEXAFS). Thiophene was found to adopt a flat
geometry on the surface with the sulphur atom in an atop position. The relatively short data
collection times required for the NIXSW technique were found to be beneficial when looking
at thiophene overlayers which are sensitive to X-ray induced damage.