A critical look at surface force measurement using a commercial atomic force microscope in the noncontact mode
P Fontaine, P Guenoun, J Daillant - Review of scientific instruments, 1997 - pubs.aip.org
The use of commercial atomic force microscopes (AFM) operating in the noncontact mode
for surface force measurements is critically reviewed. Approach curves (ie, vibration
amplitude versus tip–surface distance) using standard microfabricated tips are discussed
with respect to the basic theory of an equivalent harmonic oscillator. Different artifacts are
addressed. In particular, we show theoretically and experimentally that the force exerted by
the layer of air confined between the cantilever and the surface is a major contribution to the …
for surface force measurements is critically reviewed. Approach curves (ie, vibration
amplitude versus tip–surface distance) using standard microfabricated tips are discussed
with respect to the basic theory of an equivalent harmonic oscillator. Different artifacts are
addressed. In particular, we show theoretically and experimentally that the force exerted by
the layer of air confined between the cantilever and the surface is a major contribution to the …
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