A new increasing failure rate model for life time data
SA Siddiqui, D Nandan, S Gupta… - Microelectronics …, 1995 - Elsevier
… Some other properties like New Better than Used (NBU) are proved, which makes the
model even more versatile. We also provide original life time data, which fit well in the model.
This further proves that despite its theoretical importance, its practical applications can well
be found in real life situations. …
model even more versatile. We also provide original life time data, which fit well in the model.
This further proves that despite its theoretical importance, its practical applications can well
be found in real life situations. …
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