Analysis of GaAs photovoltaic device losses at high MOCVD growth rates

KJ Schmieder, MP Lumb, MK Yakes… - 2015 IEEE 42nd …, 2015 - ieeexplore.ieee.org
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 2015ieeexplore.ieee.org
Gallium arsenide material has been deposited via metal organic chemical vapor deposition
(MOCVD) at growth rates varying between 14 μm/hr and 56 μm/hr. Photovoltaic device
results indicate a 6-7% relative decrease in efficiency between 14 and 56 μm/hr GaAs solar
cells, due to a reduction in short-circuit current and open-circuit voltage. By simulating the
experimental characterization data, it is established that performance losses are associated
with rear surface recombination velocity and Shockley-Read-Hall lifetime. The relative …
Gallium arsenide material has been deposited via metal organic chemical vapor deposition (MOCVD) at growth rates varying between 14 μm/hr and 56 μm/hr. Photovoltaic device results indicate a 6-7% relative decrease in efficiency between 14 and 56 μm/hr GaAs solar cells, due to a reduction in short-circuit current and open-circuit voltage. By simulating the experimental characterization data, it is established that performance losses are associated with rear surface recombination velocity and Shockley-Read-Hall lifetime. The relative impact of these loss mechanisms will be quantified and conclude with discussions on their mitigation.
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