(NV) look-up tables (LUT) combined with an electrical model of a resistive random-access
memory (RRAM)-an emerging non-volatile memory (NVM) device. The Write and Read
schemes of the controller is tested for a 2x2 RRAM array. The selected RRAM successfully
switches between low0'and high1'while the unselected the RRAM remain undisturbed,
demonstrating the elimination of the intrinsic sneak-path current problem in RRAMs …