junctions is important in order to be able to accurately model the thermal properties of the
junctions. Hekking and Nazarov (Phys. Rev. B 49: 6847, 1994) developed a theory in which
NIS subgap current in thin-film structures can be modeled by multiple Andreev reflections. In
their theory, the current due to Andreev reflections depends on the junction area and the
junction resistance area product. We have measured the current due to Andreev reflections …