of conventional Au/n-Si metal–semiconductor (MS) contacts. We investigated the electronic
and photovoltaic properties of a Cu (II) complex/n-Si heterojunction diode. The ideality factor
n and barrier height Φb of the diode were 2.22 and 0.736 eV, respectively. An ideality factor
greater than unity indicates that the diode exhibits non-ideal current–voltage behavior. This
behavior results from the effect of series resistance and the presence of an interfacial layer …