free paths (IMFPs) near solid surfaces for electron energies between 50 and 10 4 eV, the
energy range of relevance for surface analysis by Auger electron spectroscopy and x-ray
photoelectron spectroscopy. This evaluation is based on IMFPs calculated from
experimental optical data and on IMFPs measured by elastic-peak electron spectroscopy
(EPES). We describe the methods used for the calculations and measurements, and we …