AlN layers and c-oriented wurtzite GaN, AlN, and Al x Ga 1− x N (x< 0.3) layers were grown
by molecular beam epitaxy on GaAs and Si (111) substrates, respectively. The Berreman
effect allows us to observe simultaneously the transverse optic and the longitudinal optic
phonons of both the cubic and the hexagonal films as transmission minima in the infrared
spectra acquired with obliquely incident radiation. We discuss our results in terms of the …