Fault modeling and fault simulation in mixed micro-fluidic microelectronic systems
HG Kerkhoff, HPA Hendriks - Journal of electronic testing, 2001 - Springer
HG Kerkhoff, HPA Hendriks
Journal of electronic testing, 2001•SpringerDevelopments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include
massive parallel DNA analysis and automatic drug synthesis. Until now, only functional
testing has been used to “guarantee” the quality of micro-fluidic systems after manufacturing.
In this paper, defect-oriented test approaches developed in analogue fault modeling and
simulation have been used to predict for the first time the faulty behavior of micro-electronic …
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include
massive parallel DNA analysis and automatic drug synthesis. Until now, only functional
testing has been used to “guarantee” the quality of micro-fluidic systems after manufacturing.
In this paper, defect-oriented test approaches developed in analogue fault modeling and
simulation have been used to predict for the first time the faulty behavior of micro-electronic …
Abstract
Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include massive parallel DNA analysis and automatic drug synthesis. Until now, only functional testing has been used to “guarantee” the quality of micro-fluidic systems after manufacturing.
In this paper, defect-oriented test approaches developed in analogue fault modeling and simulation have been used to predict for the first time the faulty behavior of micro-electronic fluidic microsystems. The modeling is targeted for use in complex electronic/fluidic microsystems employing commercial microsystem CAD tools. It enables a measure for the quality of these systems based on the performed (functional) tests and can be a guide for future test-stimuli generation and yield prediction.
Springer
以上显示的是最相近的搜索结果。 查看全部搜索结果