Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives

M Losurdo, M Bergmair, G Bruno, D Cattelan… - Journal of Nanoparticle …, 2009 - Springer
… sample or reference beam. Because spectroscopic ellipsometry also measures two values
(… The calculations have been repeated for spectral ranges centered on a lower photon energy, …

Measurement technique of ellipsometry

RW Collins - Spectroscopic Ellipsometry for Photovoltaics: Volume 1 …, 2018 - Springer
… , mapping would entail moving a collimated or focused beam relative to the fixed sample or
… detection system for imaging spectroscopic ellipsometry using an expanded incident beam

Expanded beam (macro-imaging) ellipsometry

M Fried, G Juhasz, C Major, P Petrik, O Polgar… - Thin Solid Films, 2011 - Elsevier
… Our aim was to make possible to use spectroscopic ellipsometry … detector system and it works
as an unusual kind of imaging … methods based on one narrow beam (collimated or focused

[图书][B] Spectroscopic ellipsometry for photovoltaics

H Fujiwara, RW Collins - 2018 - Springer
… measurements and data analyses properly, with a focus on the … , mapping would entail
moving a collimated or focused beam … detection system for imaging spectroscopic ellipsometry

[PDF][PDF] Spectroscopic ellipsometry

R Pascu, M Dinescu - Romanian Reports in Physics, 2012 - rrp.nipne.ro
… are focused on improving the precision of ellipsometric … In the case of VASE systems,
the data analysis is made by … the light beam used in spectroscopic ellipsometry is typically …

DUV broadband spectroscopic ellipsometer based on all-reflective focusing optical system

G Song, G Cui, Y Chen, T Liu… - 2013 Third International …, 2013 - ieeexplore.ieee.org
focused beam spectroscopic ellipsometer over the spectra range from 200 nm to 1000 nm.
The ellipsometer is based on all-reflective focusing optical systembeam with small focus spot …

Ellipsometry as a high-precision technique for subnanometer-resolved monitoring of thin-film structures

VA Shvets, EV Spesivtsev, SV Rykhlitskii… - Nanotechnologies in …, 2009 - Springer
… in the optical properties of the system under study. Therefore, … optic lens microsystem to
focus the laser beam into a spot 10 … from data obtained with a spectral ellipsometer [46]. Arrows …

Ellipsometer measurements using focused and masked beams

D Barton, FK Urban III - Thin solid films, 2006 - Elsevier
… The ellipsometry method consists of data acquisition, data … to the measured data through
a system of equations which are … size for collimated beam spectral ellipsometry is between 2 …

Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology

LR Dahal, J Li, JA Stoke, Z Huang, A Shan… - Solar energy materials …, 2014 - Elsevier
… processes by advanced spectroscopic ellipsometry (SE) techniques establishes the … The
first focus of Section 4 of this review is a recent investigation of a PECVD process for the i-layer …

Spectroscopic ellipsometry and morphological studies of nanocrystalline NiO and NiO/ITO thin films deposited by e-beams technique

M Emam-Ismail, M El-Hagary, HM El-Sherif… - Optical materials, 2021 - Elsevier
… indexed on the bases of a polycrystalline face-centered cubic (FCC) structure type (JCPDS …
to an appropriate optical model that accurately describes thin film system under investigation…