films were prepared using a solution casting method. These films were subjected to 8 MeV
electron beam radiation at a dose of up to 300 kGy in air at room temperature. The free
volume related microstructural and electrical properties of these irradiated films were studied
using various characterization methods, such as positron annihilation lifetime spectroscopy
(PALS) and AC & DC conductivity measurement techniques. The variations in the positron …