新式兩相多孔性低介電材料及其製程之探討(I)

呂志鵬 - 2005 - ir.lib.nycu.edu.tw
… the exposed porous dielectric cross-section by etching step … We intend to examine the impact
of medium-high temperature … in dense MSQ and porous low-k directly formed after dielectric …

薄膜電晶體主動式矩陣面板之陣列技術研究

陳紀文, 曾俊元, 張鼎張 - 2004 - ir.lib.nycu.edu.tw
… properties of low-k nano-porous silica and the impact of … performed with lithography and
etching processes. In our proposed … effects on the n-type poly-Si TFT with/without LDD structure

新式含接枝型聚苯乙烯起孔洞劑之甲基矽氧烷低介電材料製成及結構特性分析

邱詩雅, 呂志鵬 - 2008 - ir.lib.nycu.edu.tw
… Solvent effect on the pore size of porous low-k films ........................… 2.5 Challenge of porous
low k integration Porous low k … uptake Porous low k may absorb moisture in wet etching, wet …

多孔性及兩相式(MSQ/高溫起孔洞劑) 低介電材料之吸水性與擴散行為研究

鄧鈞元, 呂志鵬 - 2007 - ir.lib.nycu.edu.tw
… layer on the top of porous or hybrid low-k films. Such thin but … by processing steps such
as CMP, post-etch cleaning, post-… to investigate the impact of porogens and porosity on the …

電漿製程對多孔隙低介電材料結構, 電性及可靠度之影響

黃俊夫 - 2013 - airitilibrary.com
… the effect of different kinds of plasma on porous low-k … ) materials by using standard and
remote plasma methods, and … dielectric film worse such as the etching rate by HF, and because …

低介電常數材料應用於多層導體連線之電特性分析

方國龍, 崔秉鉞, 陳茂傑 - 2004 - ir.lib.nycu.edu.tw
… in a stripline structure with spin-coated porous-SiLK low-k film. … Except the k value, the impact
of low-k materials on process … photo-lithography process and dielectric etch processes are …

多孔性低介電奈米群集二氧化矽薄膜結構與性質關係之探討

莊茹媖, 呂志鵬 - 2008 - ir.lib.nycu.edu.tw
… the structure-property relationship of NCS porous low-k thin … Their impact on the final properties
of NCS porous low-k thin film … the PSZ low-k film was subjected to etch or ash process; it …

超临界二氧化碳介质中晶圆清洗与选择性刻蚀研究进展

张泽欣, 郑伟中, 徐益升, 胡冬冬, 卓欣宇, 宗原… - 化工学报 - hgxb.cip.com.cn
… post-etch residues from patterned porous low-k dielectrics[J]. Journal of Vacuum Science
& Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and …

皮秒雷射應用在三維晶片矽導孔及Low-k 晶圓切割研究

王辰 - 義守大學機械與自動化工程學系學位論文, 2014 - airitilibrary.com
process to observe the effect of silicon wafer material after laser drill. Parameters used in this
work are speed, path and power. The effect of … grooving on 45 nm low-k wafer is conducted. …

低介電常數材料之研究及其在深次微米金屬半導體積體電路之製程整合之研究

鄭義榮, 馮明憲 - 2004 - ir.lib.nycu.edu.tw
… compatibility of low-k materials on semiconductor process. On … and hardness due to decreasing
micro-porous. However, a bit … Cu and low-k film as Cu diffusion barrier and etching stop …