A 'mesh'seed layer for improved through-silicon-via fabrication

JH Lai, HS Yang, H Chen, CR King… - Journal of …, 2010 - iopscience.iop.org
… This paper describes an improved method of forming and removing seed layers for
through-silicon-vias (TSVs) in applications such as MEMS, sensors and packaging (silicon carrier, for …

A wafer-based monocrystalline silicon photovoltaics road map: Utilizing known technology improvement opportunities for further reductions in manufacturing costs

A Goodrich, P Hacke, Q Wang, B Sopori… - Solar Energy Materials …, 2013 - Elsevier
… The very first step in the fabrication of a c-Si wafer is the production of metallurgical grade
silicon via the high-temperature reduction of silica (the source of which is typically lumpy quartz…

Silicon nanowire anode: Improved battery life with capacity-limited cycling

V Chakrapani, F Rusli, MA Filler, PA Kohl - Journal of Power Sources, 2012 - Elsevier
… Half cells of Si/Li, when cycled at a constant … improvement in the battery performance with
cycle life (>650 cycles and columbic efficiencies close to 100%). Finally, in order to improve the …

Through-silicon via (TSV)

M Motoyoshi - Proceedings of the IEEE, 2009 - ieeexplore.ieee.org
… This technology allows stacked silicon chips to interconnect through direct contact to
provide high-speed signal processing and improved photo detection for image sensing. …

An improved 100 GHz equivalent circuit model of a through silicon via with substrate current loop

K Kim, K Hwang, S Ahn - IEEE Microwave and Wireless …, 2016 - ieeexplore.ieee.org
… cuit model for through silicon via (TSV) with consideration of the effective substrate current
loop in silicon substrate and proximity effect on the currents in the TSV. The proposed model …

Accuracy-improved through-silicon-via model using conformal mapping technique

TY Cheng, CD Wang, YP Chiou… - 2011 IEEE 20th …, 2011 - ieeexplore.ieee.org
… -TEM modes in through-silicon via (TSV… through-silicon via (TSV) based on the conformal
mapping method to modify the conventional model in admittance (CG) parts. With the improved

Thermo-mechanical analysis of an improved thermal through silicon via (TTSV) structure

LJ Huang, WS Zhao - Progress In Electromagnetics Research M, 2013 - jpier.org
Temperature and thermal stress responses of an improved TTSV structure under the impact
of hotspots are numerically analyzed in this paper. A Fin structure is added to the circular …

Improved staggered through silicon via inductors for RF and power applications

X Sun, G Van der Plas, E Beyne - 2018 IEEE 68th electronic …, 2018 - ieeexplore.ieee.org
… inductor and the Si substrate to reduce loss and improve the Q … for 3D connections is the
through silicon via (TSV) [3,4], which … focus on improving the inductor performance through the …

Improved transmission line model for high-frequency modelling of through silicon vias

V Gerakis, A Hatzopoulos - International Journal of Electronics, 2019 - Taylor & Francis
Through Silicon Via (TSV) testing methods and improve the … Transmission Line Model
and improved through the fitting to … TSVs that alters the paths through which current flows is …

Integrated through-silicon-via-based inductor design in buck converter for improved efficiency

A Namoune, R Taleb, N Mansour… - Electrical Engineering …, 2023 - eie.khpi.edu.ua
Introduction. Through-silicon-via (TSV) is one of the most important components of 3D
integrated circuits. Similar to two-dimensional circuits, the performance evaluation of 3D circuits …