Integration of the scan-test method into an architecture specific core-test approach
C Feige, JT Pierick, C Wouters, R Tangelder… - Journal of Electronic …, 1999 - Springer
C Feige, JT Pierick, C Wouters, R Tangelder, HG Kerkhoff
Journal of Electronic Testing, 1999•SpringerIn this paper a concept is proposed to combine a bus-transfer based test approach (AMBA)
with the well-known scan-test technique. This novel approach combines the advantages of
modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-
market cycles (scan). The consequences with respect to test hardware implementation and
tool flow are discussed.
with the well-known scan-test technique. This novel approach combines the advantages of
modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-
market cycles (scan). The consequences with respect to test hardware implementation and
tool flow are discussed.
Abstract
In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. This novel approach combines the advantages of modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-market cycles (scan). The consequences with respect to test hardware implementation and tool flow are discussed.
Springer
以上显示的是最相近的搜索结果。 查看全部搜索结果