Large-scale direct patterning of aligned single-walled carbon nanotube arrays using dip-pen nanolithography

JH Lee, CK Najeeb, GH Nam, Y Shin, JH Lim… - Chemistry of …, 2016 - ACS Publications
JH Lee, CK Najeeb, GH Nam, Y Shin, JH Lim, JH Kim
Chemistry of Materials, 2016ACS Publications
The strength of dip-pen nanolithography (DPN) is the ability to create nano-or microarrays of
organic compounds and nanomaterials in a nondestructive and direct-write manner.
However, transporting large-sized ink materials, such as carbon nanotubes (CNTs), has
been a significant challenge. We report a direct-write patterning of aligned single-walled
carbon nanotube (SWNT) arrays on silicon oxide using DPN. The patterned SWNT arrays
show a high degree of alignment and controllable width ranging from 2 μm down to 8 nm …
The strength of dip-pen nanolithography (DPN) is the ability to create nano- or microarrays of organic compounds and nanomaterials in a nondestructive and direct-write manner. However, transporting large-sized ink materials, such as carbon nanotubes (CNTs), has been a significant challenge. We report a direct-write patterning of aligned single-walled carbon nanotube (SWNT) arrays on silicon oxide using DPN. The patterned SWNT arrays show a high degree of alignment and controllable width ranging from 2 μm down to 8 nm. Furthermore, field-effect transistors based on these SWNT arrays show p-type characteristic. High-throughput patterning of the aligned SWNTs over a large area was also achieved via polymer pen lithography (PPL). The reported technique will further expand the application of SWNTs to diverse nanoelectronic devices.
ACS Publications
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