0.5). We have deposited, by DC sputtering at 150° C, amorphous YBCO (a-YBCO)
semiconducting films to evaluate their potential as sensing layer for thermal detection of
infrared (IR) radiation. Low temperature elaboration is a key advantage to integrate a
radiation detector on a silicon chip bearing already processed readout electronics. We have
studied an a-YBCO/metal planar structure test vehicle in the near-IR, concentrating on the …