Measurement challenges for 5G and beyond: An update from the National Institute of Standards and Technology
KA Remley, JA Gordon, D Novotny… - IEEE Microwave …, 2017 - ieeexplore.ieee.org
KA Remley, JA Gordon, D Novotny, AE Curtin, CL Holloway, MT Simons, RD Horansky…
IEEE Microwave Magazine, 2017•ieeexplore.ieee.orgThe NIST CTL has launched several new programs to support advances in 5G mmW and
multiple-antenna technology. The high levels of electronic device integration anticipated for
5G wireless technology yield a radically new connectorless measurement paradigm in
which “on-wafer to OTA” measurements will be the norm. This increased reliance on OTA
testing represents a large focus of NIST's work. Also, measurements, calibrations, and
channel characterization in the mmW frequency bands must be corrected for the …
multiple-antenna technology. The high levels of electronic device integration anticipated for
5G wireless technology yield a radically new connectorless measurement paradigm in
which “on-wafer to OTA” measurements will be the norm. This increased reliance on OTA
testing represents a large focus of NIST's work. Also, measurements, calibrations, and
channel characterization in the mmW frequency bands must be corrected for the …
The NIST CTL has launched several new programs to support advances in 5G mmW and multiple-antenna technology. The high levels of electronic device integration anticipated for 5G wireless technology yield a radically new connectorless measurement paradigm in which “on-wafer to OTA” measurements will be the norm. This increased reliance on OTA testing represents a large focus of NIST's work. Also, measurements, calibrations, and channel characterization in the mmW frequency bands must be corrected for the increasingly nonideal hardware found at mmW frequencies. Measurement science can play a significant role in addressing these technical challenges through new calibrations, models, and uncertainty analyses.
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