Non-resonant frequency components observed in a dynamic Atomic Force Microscope

H Nagao, T Uruma, K Shimizu, N Satoh… - Nonlinear Theory and Its …, 2017 - jstage.jst.go.jp
H Nagao, T Uruma, K Shimizu, N Satoh, K Suizu
Nonlinear Theory and Its Applications, IEICE, 2017jstage.jst.go.jp
The oscillating behavior of a micro-cantilever probe plays a central role in the atomic force
microscope for studying a nanoscale sample. The oscillatory phenomena in the microscope
are numerically investigated by exciting the probe with a single frequency. We observe the
non-resonant frequency components, which correspond to a frequency of transient beats
superimposed on the stable solution, around the natural frequency of the probe, when the
probe is close to the sample. The difference between the non-resonant frequency and the …
Abstract
The oscillating behavior of a micro-cantilever probe plays a central role in the atomic force microscope for studying a nanoscale sample. The oscillatory phenomena in the microscope are numerically investigated by exciting the probe with a single frequency. We observe the non-resonant frequency components, which correspond to a frequency of transient beats superimposed on the stable solution, around the natural frequency of the probe, when the probe is close to the sample. The difference between the non-resonant frequency and the natural frequency changes when the tip-sample distance decreases. Furthermore, we investigate the originating point of the non-resonant frequency components as a function of the tip-sample distance. In addition, we perform an actual experiment for observing the frequency components near the resonant frequency.
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