In this paper, we propose a technique to characterize integrated power splitters and waveguide losses. Taking advantage of the time domain resolution of an optical frequency domain interferometry measurement, we present two versions of a test device comprising interferometers and the power splitters under test providing a mean to characterize the splitting power ratio of them and the losses of the employed integrated waveguides, in a single (or double) measurement wavelength-resolved scheme. We provide details on the model and examples of the numerical work supporting its validity. To conclude, we provide some discussion of the techinque, including the possible implementations for future experimental validation.