Polarized x-ray spectroscopy of quaternary ferromagnetic semiconductor (Ga, Mn)(As, P) thin films
X-ray magnetic circular dichroism (XMCD) is used to study the magnetic and electronic
properties of the quaternary diluted magnetic semiconductor (Ga, Mn)(As, P) as a function of
the P concentration y. A clear signature of the variation in strain, from compressive to tensile
on increasing y, is observed in the angular dependence of the hybridized d 5-like Mn L 2, 3
XMCD spectra. The ferromagnetic transition temperature and magnetic moment per Mn ion
both decrease steadily with increasing y.
properties of the quaternary diluted magnetic semiconductor (Ga, Mn)(As, P) as a function of
the P concentration y. A clear signature of the variation in strain, from compressive to tensile
on increasing y, is observed in the angular dependence of the hybridized d 5-like Mn L 2, 3
XMCD spectra. The ferromagnetic transition temperature and magnetic moment per Mn ion
both decrease steadily with increasing y.
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