Quantitative determination of contact stiffness using atomic force acoustic microscopy
U Rabe, S Amelio, E Kester, V Scherer, S Hirsekorn… - Ultrasonics, 2000 - Elsevier
Atomic force acoustic microscopy is a near-field technique which combines the ability of
ultrasonics to image elastic properties with the high lateral resolution of scanning probe
microscopes. We present a technique to measure the contact stiffness and the Young's
modulus of sample surfaces quantitatively, with a resolution of approximately 20nm,
exploiting the contact resonance frequencies of standard cantilevers used in atomic force
microscopy. The Young's modulus of nanocrystalline ferrite films has been measured as a …
ultrasonics to image elastic properties with the high lateral resolution of scanning probe
microscopes. We present a technique to measure the contact stiffness and the Young's
modulus of sample surfaces quantitatively, with a resolution of approximately 20nm,
exploiting the contact resonance frequencies of standard cantilevers used in atomic force
microscopy. The Young's modulus of nanocrystalline ferrite films has been measured as a …