Relaxation spectrum of the TlSbSe2 thin films
D Deger, K Ulutas, S Yildirim, N Kalkan - Physica B: Condensed Matter, 2009 - Elsevier
The dielectric constant and the dielectric loss of TlSbSe2 thin films, obtained via thermal
evaporation of TlSbSe2 crystals grown by Stockber-Bridgman technique, have been
measured using ohmic Al electrodes in the frequency range 0.2–100KHz and within the
temperature interval 293–353K. The capacitance are found to decrease with increasing
frequency and increase with increasing temperature. The activation energy values were
evaluated too. A good agreement between the activation energy values obtained from …
evaporation of TlSbSe2 crystals grown by Stockber-Bridgman technique, have been
measured using ohmic Al electrodes in the frequency range 0.2–100KHz and within the
temperature interval 293–353K. The capacitance are found to decrease with increasing
frequency and increase with increasing temperature. The activation energy values were
evaluated too. A good agreement between the activation energy values obtained from …