Shelf life prediction by intelligent RFiD–Technical limits of model accuracy
R Jedermann, JP Emond, W Lang - Dynamics in Logistics: First …, 2008 - Springer
R Jedermann, JP Emond, W Lang
Dynamics in Logistics: First International Conference, LDIC 2007, Bremen …, 2008•SpringerAbstract Information about current quality state enables large improvements in the dynamic
planning for the logistics of fresh products. The main reason for quality losses are
temperature deviations. This article investigates how a prediction system that delivers a shelf
life prediction at each transhipment point could be integrated into a semi-passive RFID label.
Limiting factors for the possible predictions accuracy like model tolerances and the bound
processing resources of low-power microcontrollers will be evaluated.
planning for the logistics of fresh products. The main reason for quality losses are
temperature deviations. This article investigates how a prediction system that delivers a shelf
life prediction at each transhipment point could be integrated into a semi-passive RFID label.
Limiting factors for the possible predictions accuracy like model tolerances and the bound
processing resources of low-power microcontrollers will be evaluated.
Abstract
Information about current quality state enables large improvements in the dynamic planning for the logistics of fresh products. The main reason for quality losses are temperature deviations. This article investigates how a prediction system that delivers a shelf life prediction at each transhipment point could be integrated into a semi-passive RFID label. Limiting factors for the possible predictions accuracy like model tolerances and the bound processing resources of low-power microcontrollers will be evaluated.
Springer
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