The NIST electron effective-attenuation-length database
CJ Powell, A Jablonski - Journal of surface analysis, 2002 - jlc.jst.go.jp
The NIST Electron Effective-Attenuation-Length Database provides values of electron
effective attenuation lengths (EALs) in solid elements and compounds at selected electron
energies between 50 eV and 2, 000 eV. The database was designed mainly to provide EALs
(to account for effects of elastic-electron scattering) for applications in surface analysis by
Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). For these
applications, EALs are needed mainly for measurements of the thicknesses of overlayer …
effective attenuation lengths (EALs) in solid elements and compounds at selected electron
energies between 50 eV and 2, 000 eV. The database was designed mainly to provide EALs
(to account for effects of elastic-electron scattering) for applications in surface analysis by
Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). For these
applications, EALs are needed mainly for measurements of the thicknesses of overlayer …
The nist electron effective-attenuation-length database
A Jablonski - Journal of Surface Analysis, 2002 - jstage.jst.go.jp
抄録 The NIST Electron Effective-Attenuation-Length Database provides values of electron
effective attenuation lengths (EALs) in solid elements and compounds at selected electron
energies between 50 eV and 2, 000 eV. The database was designed mainly to provide EALs
(to account for effects of elastic-electron scattering) for applications in surface analysis by
Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). For these
applications, EALs are needed mainly for measurements of the thicknesses of overlayer …
effective attenuation lengths (EALs) in solid elements and compounds at selected electron
energies between 50 eV and 2, 000 eV. The database was designed mainly to provide EALs
(to account for effects of elastic-electron scattering) for applications in surface analysis by
Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). For these
applications, EALs are needed mainly for measurements of the thicknesses of overlayer …
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