morphology, and optical properties of Co 3 O 4 thin films annealed at 300–500C° were
studied by X-ray diffraction, energy dispersive X-ray, scanning electron microscopy, and UV–
visible spectroscopy. The as-deposited film had no diffracted peaks in the XRD analysis,
indicating very low film crystallinity. The spinel cubic Co 3 O 4 phase formed with preferred
orientation along the (3 1 1) plane during annealing of the films to 500C°. As the film …