The heat exchange simulation in the device for measuring the emissivity of coatings and material surfaces
V Babak, O Dekusha, L Vorobiov… - 2019 IEEE 39th …, 2019 - ieeexplore.ieee.org
2019 IEEE 39th International Conference on Electronics and …, 2019•ieeexplore.ieee.org
The simulation of heat exchange in the working chamber of the device for measuring
emissivity was carried. It was shown that the simulation results coincide well with the
experimental results. Established that, with the selected technical parameters, the
contribution of the conductive-convective component of heat exchange does not exceed
0.1% of the radiation component, and therefore the measurement can be carried out without
vacuuming the working chamber. Found suitable area for measurement of emissivity with …
emissivity was carried. It was shown that the simulation results coincide well with the
experimental results. Established that, with the selected technical parameters, the
contribution of the conductive-convective component of heat exchange does not exceed
0.1% of the radiation component, and therefore the measurement can be carried out without
vacuuming the working chamber. Found suitable area for measurement of emissivity with …
The simulation of heat exchange in the working chamber of the device for measuring emissivity was carried. It was shown that the simulation results coincide well with the experimental results. Established that, with the selected technical parameters, the contribution of the conductive-convective component of heat exchange does not exceed 0.1% of the radiation component, and therefore the measurement can be carried out without vacuuming the working chamber. Found suitable area for measurement of emissivity with unevenness of the heat flux distribution, which does not exceed ± 2%.
ieeexplore.ieee.org
以上显示的是最相近的搜索结果。 查看全部搜索结果