Understanding reduced-voltage operation in modern DRAM devices: Experimental characterization, analysis, and mechanisms
… (i) experimentally characterize and analyze real modern DRAM chips operating at different
supply … a solid and thorough understanding of how reduced-voltage operation affects latency, …
supply … a solid and thorough understanding of how reduced-voltage operation affects latency, …
[PDF][PDF] Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms
… (i) experimentally characterize and analyze real modern DRAM chips operating at different
supply … a solid and thorough understanding of how reduced-voltage operation affects latency, …
supply … a solid and thorough understanding of how reduced-voltage operation affects latency, …
What your DRAM power models are not telling you: Lessons from a detailed experimental study
… METHODOLOGY To develop a thorough understanding of the factors that affect DRAM …
experimental characterization and analysis of the power consumption of real modern DRAM chips…
experimental characterization and analysis of the power consumption of real modern DRAM chips…
Understanding rowhammer under reduced wordline voltage: An experimental study using real dram devices
… We provide the first experimental characterization of how word… of a DRAM row in terms
of 1) the fraction of DRAM cells that … of reducedvoltage DRAM operation, 2) experimental …
of 1) the fraction of DRAM cells that … of reducedvoltage DRAM operation, 2) experimental …
Design-induced latency variation in modern DRAM chips: Characterization, analysis, and latency reduction mechanisms
… extensive experimental analysis, we develop two mechanisms that reliably reduce DRAM
latency. … In order to define and understand the design-induced variation in modern DRAM, we …
latency. … In order to define and understand the design-induced variation in modern DRAM, we …
Revisiting rowhammer: An experimental analysis of modern dram devices and mitigation techniques
… To help overcome this lack of understanding, we need a unifying study of the RowHammer …
rigorous experimental characterization study of DRAM chips from three different DRAM types (…
rigorous experimental characterization study of DRAM chips from three different DRAM types (…
Voltron: Understanding and Exploiting the Voltage-Latency-Reliability Trade-Offs in Modern DRAM Chips to Improve Energy Efficiency
… We believe our experimental characterization results and … understanding and leveraging
reduced-voltage operation … of enabling reduced-voltage operation in manufactured DRAM chips…
reduced-voltage operation … of enabling reduced-voltage operation in manufactured DRAM chips…
Understanding the interactions of workloads and DRAM types: A comprehensive experimental study
… We perform a rigorous experimental characterization of system performance and DRAM …
Our characterization yields twelve key observations (highlighted in boxes) and many other …
Our characterization yields twelve key observations (highlighted in boxes) and many other …
Understanding and modeling on-die error correction in modern DRAM: An experimental study using real devices
… Fourth, we demonstrate EIN’s usefulness by providing a proof-of-concept experimental
characterization study of the data-retention error rates for the DRAM devices with on-die ECC. …
characterization study of the data-retention error rates for the DRAM devices with on-die ECC. …
An experimental study of reduced-voltage operation in modern FPGAs for neural network acceleration
… Specifically, we experimentally study the reduced-voltage operation of … Understanding
reduced-voltage operation in modern DRAM devices: Experimental characterization, analysis, …
reduced-voltage operation in modern DRAM devices: Experimental characterization, analysis, …