Key for optical microresonator engineering, the total intrinsic loss is easily determined by spectroscopy; however, quantitatively separating absorption and radiative losses is challenging, and there is not a general and robust method. Here, we propose and experimentally demonstrate a general all-optical characterization technique for separating the loss mechanisms with high confidence using only linear spectroscopic measurements and an optically measured resonator thermal time constant. We report the absorption, radiation, and coupling losses for ten whispering-gallery modes of three different radial orders on a Si microdisk. Although the total dissipation rates show order-of-magnitude differences, the small absorptive losses are successfully distinguished from the overwhelming radiation losses and show similar values for all the modes as expected for the bulk material absorption.