four rectangular atomic force microscope cantilevers made of silicon have been examined
experimentally in a spectral range of 100 kHz to 10 MHz. A good agreement with the flexural
wave theory of elastic beams was found. Coupling to torsional vibrations was also observed.
When the sensor tip of the cantilever is in contact with a sample surface the resonances are
shifted in frequency and the vibration amplitudes along the cantilever change. A method is …