M Razeghi, YH Choi, X He, CJ Sun - Materials science and …, 1995 - Taylor & Francis
… GaInAsP/GaAs system has also been investigated as an alternative to the widely used AIGaAs/GaAs systemfor deviceapplications … in service of several devices based on these material …
ST Jolly, SY Narayan, JP Paczkowski… - Semiconductor …, 1982 - spiedigitallibrary.org
… This paper describes the vapor-phase epitaxial (VPE) growth and characterization of GaAs … the growth of GaAs and (n -type) GaxInl__,As P1_ alloys for microwave deviceapplications. …
CW Tu - Journal of Physics: Condensed Matter, 2001 - iopscience.iop.org
… applications are presented: InNAsP/InP, GaInNAs/GaAs, Ga(… InNAsP/GaInAsP quantum wells grown on InP are superior … ), as compared to GaInAs/GaInAsP quantum wells, because of …
JP Duchemin, JP Hirtz, M Razeghi, M Bonnet… - Journal of Crystal …, 1981 - Elsevier
… by stoplayers of monocrystalline GaInAs and GaInAsP corn- … subsequent layer, or by opto-electronic deviceapplications. … GaAs and InP grown at low pressure, the growth rate The …
G Zhang, A Ovtchinnikov, J Näppi, T Hakkarainen… - Journal of crystal …, 1993 - Elsevier
… This study suggests that GSMBE is suitable for the growth of GaInAsP lattice matched to GaAs, and the GaInAsP is a promising candidate for optoelectronic deviceapplications. …
… other applications. The GalnAsP/InP system appears to be ideally suited to the fabrication of such devices, … age generated by AlxGal_~s-GaAs pn heterojunctions have been reported by …
F Dimroth, M Grave, P Beutel, U Fiedeler… - … and Applications, 2014 - Wiley Online Library
… Solar cell structures for the InP-based and GaAs-based tandem devices were grown … best wafer bonded GaInP/GaAs//GaInAsP/GaInAs four-junction solar cell device. The current under …
SM Bedair, T Katsuyama, PK Chiang… - Journal of Crystal …, 1984 - Elsevier
… lattice-matched to a GaAs substrate and thus have potential applications in several electronic devices such as HEMT, … Growth conditions were adjusted to grow GaAsP—GaInAsP with a …
… lower than the values that have been reported for GaAs. These results suggest that the insulator for MIS devices using GaInAsP (and InP) should not be produced by anodic oxidation. …