… A scan-based testing is also a structural test that checks flipflops or latches, combinational …
it can be changed by shifting patterns through the flip flops when they are configured into shift …

… A test chip is fabricated using a 0.2- m fully-depleted silicon-on-insulator standard cell …
The SET and SEU soft error rates are successfully measured by the scan FFs on the test chip. A …

… It contains four bit register on the inputs 4-7, which is composed of D-type flip-flops. The EED…
the test pattern generator for this circuit. The flip-flops in the CUT as well as the test pattern …

… Design is tested for various substrate bias voltages in the sub - threshold region to opt for
better design. The comparison between previously reported design and modified design is …

… scan test power consumption in CMOS circuits. Our method explores the capability of flipflops …
efficient handling of test patterns. We also exploit the unspecified or the don’t care bits in a …

Power consumption of any circuit is high during test mode than its normal mode of functioning.
Different techniques are proposed to reduce the test power. This paper presents the …

… path running through the fault site to the test observation points (ie, flip-flops (FFs) or
primary outputs (POs)). For each fault site, there are two possible faults: slow-to-rise or slow-to-fall. …

… Simulation results indicate that the proposed flip-flops provide uniform latency for a … to
conventional flip-flops. To evaluate the performance of the proposed flip-flops, test structures were …

… scan flipflop grouping scheme for LOC delay testing. Scan flip-flops are grouped to establish
multiple scan trees. The initial vector of each test pair is applied to the scan flip-flops first. …

… As a result, the time required to apply these test vectors is becoming a source of increasing
worry. The VLSI test community is currently facing a significant difficulty in testing extremely …