… Kelvin probe force microscopy, or KPFM, was introduced as a tool to measure the local
contact potential difference between a conducting atomic force microscopy (AFM) tip and the …

… by using a modified version of the ac scanning force microscope.2*3’5’6 The principle is
similar to the Kelvin method except that forces are measured instead of currents. An additional …

Seven years have passed since the first volume “Kelvin probe force microscopy—Measuring
and compensating electrostatic forces” has been published in 2011. It presented the first …

… This review highlights the potential of Kelvin probe force microscopy (KPFM) beyond
imaging to simultaneously study structural and electronic properties of functional surfaces and …

… Both scanning tunneling microscopy STM and atomic force microscopy AFM have been
modified to obtain high … In particular, variations of the Kelvin probe force microscope6–8 …

… We compared two Kelvin probe force microscopy methods with regard to accuracy and
resolution: the amplitudesensitive and the frequency-detection methods. As described in detail, …

… We present a comprehensive three-dimensional analysis of Kelvin probe force microscopy
of … Our model is compared to ultrahigh vacuum Kelvin probe force microscopy measurements …

… The combination of atomic force microscopy and Kelvin probe technology is a powerful
tool to obtain high-resolution maps of the surface potential distribution on conducting and …

… Kelvin probe force microscopy was applied to the … The spatial resolution of Kelvin probe
force microscopy … that the measured Kelvin probe force microscopy potential reflects the surface …

… the pulsed force mode of atomic force microscopy. Our technique, named pulsed … Kelvin
probe force microscopy (AM-KPFM) and frequency-modulation Kelvin probe force microscopy (…