V Gherman, C Laffond - 2024 IEEE 42nd VLSI Test Symposium …, 2024 - ieeexplore.ieee.org
110 天前 - … be applied to any linear block ECC able to correct up to t erroneous bits (t > 1)
per code word as long as the correction of r-bit errors (r < t) and the detection of t-bit and (t+1)-bit …