[PDF][PDF] Advanced Atomic force microscopy: Exploring measurements of local electric properties
S Magonov, J Alexander - Application Note, Agilent Technologies, Inc, 2008 - Citeseer
In the past two decades Atomic Force Microscopy (AFM) 1 has been recognized as a
powerful characterization method of surfaces at small scales and in different environments …
powerful characterization method of surfaces at small scales and in different environments …
Advancing characterization of materials with atomic force microscopy-based electric techniques
S Magonov, J Alexander, S Wu - Scanning Probe Microscopy of …, 2010 - Springer
Multifrequency measurements in atomic force microscopy (AFM) are one of the main
techniques advancing this method. Detection of the AFM probe response at different …
techniques advancing this method. Detection of the AFM probe response at different …
Atomic force microscopy: A powerful tool for electrical characterization
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface
by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has …
by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has …
Electrical measurement techniques in atomic force microscopy
A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …
conventional topographic imaging to electrical surface characterization. The conductive tip …
AFM-Based Characterization of Electrical Properties of Materials
J Alexander, S Belikov, S Magonov - Nanoscale Imaging: Methods and …, 2018 - Springer
Capabilities of atomic force microscopy (AFM) for characterization of local electrical
properties of materials are presented in this chapter. At the beginning the probe–sample …
properties of materials are presented in this chapter. At the beginning the probe–sample …
Visualization of nanostructures with atomic force microscopy
SN Magonov, NA Yerina - Handbook of microscopy for nanotechnology, 2005 - Springer
114 I. Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication
of AFM, as characterization technique, is further increasing with recent developments in …
of AFM, as characterization technique, is further increasing with recent developments in …
Atomic force microscopy
C Frétigny - Nanoscience: Nanotechnologies and Nanophysics, 2007 - Springer
The atomic force microscope (AFM) is undoubtedly the most widely used of the local probe
devices. It gives quick access to a wide range of surface properties, including mechanical …
devices. It gives quick access to a wide range of surface properties, including mechanical …
Multi-frequency atomic force microscopy
R Proksch - Scanning Probe Microscopy of Functional Materials …, 2010 - Springer
The atomic force microscope (AFM) was invented in 1986 [1], a close relative of another
instrument, the scanning tunneling microscope (STM), invented in 1981 [2]. Both fall under …
instrument, the scanning tunneling microscope (STM), invented in 1981 [2]. Both fall under …
Quantitative atomic force microscopy
H Söngen, R Bechstein, A Kühnle - Journal of Physics …, 2017 - iopscience.iop.org
A variety of atomic force microscopy (AFM) modes is employed in the field of surface
science. The most prominent AFM modes include the amplitude modulation (AM) and the …
science. The most prominent AFM modes include the amplitude modulation (AM) and the …
Highly Sensitive Electrostatic Force Detection Using Small Amplitude Frequency-Modulation Atomic Force Microscopy in the Second Flexural Mode
K Nishi, Y Hosokawa, K Kobayashi… - e-Journal of Surface …, 2011 - jstage.jst.go.jp
Frequency-modulation atomic force microscopy (FMAFM) is a powerful imaging tool with a
high force sensitivity [1, 2]. In FM-AFM, the interaction force between the tip and the sample …
high force sensitivity [1, 2]. In FM-AFM, the interaction force between the tip and the sample …