Atomic force microscopy (AFM)[1] is a novel technique for high resolution imaging of
conducting as well as nonconducting surfaces. As shown in Fig. 3.1, the physical property …

Amplitude modulation atomic force microscopy (AM-AFM) also known as tapping mode AFM
is arguably the dominant technique for nanometer-scale characterization of surfaces in air …

Atomic force microscopy is an amazing technique that allies a versatile methodology (that
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …

Atomic force microscopy (AFM) belongs to the high resolution and high sensitivity surface
imaging technologies. In this method force interactions between the tip and the surface are …

Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact
resonance, force modulation, piezoresponse force microscopy, electrochemical strain …

The cantilever deflection sensor is one of the most important and sensitive elements of the
atomic force microscope (AFM). Of all methods proposed to detect cantilever deflection, the …

Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale
surface properties, such as topography, viscoelasticity, electrical potential and conductivity …

Atomic force microscopy (AFM) is an analytical surface characterization tool that reveals the
surface topography at a nanometer length scale while probing local chemical, mechanical …

Since its invention1 the atomic force microscope AFM has gained great popularity in many
fields, for example, in biological and biophysical research, 2–4 polymer physics, 5, 6 and …

Small cantilevers with ultra-high resonant frequencies (1–3 MHz) have paved the way for
high-speed atomic force microscopy. However, their potential for multi-frequency atomic …