In this paper, a new scan flip-flop is proposed for low power testing. Different flip-flops
(Master-slave, hybrid, pulse triggered) are reviewed and evaluated their performance using …

Over the years, The semiconductor industry has made tremendously impressive
improvement in terms of density of very large-scale integrated (VLSI) circuits. Increasing …

Power consumption in scan based testing is high due to the toggling of the combinational
logic during the scan shift. In this paper, we present a modified Scan Flip-flop architecture …

Power consumption of a circuit is more in test mode than normal mode. The increased heat
due to excess power dissipation can open up reliability issue due to electro-migration. In …

Power dissipation in digital systems may be significantly high during scan testing where a
large portion of power is consumed in the combinational part. This paper presents a new …

Power consumption of very large scale integrated (VLSI) systems is much higher during
testing as a result of increased circuit activity. This paper presents a novel low-power D flip …

At-speed testing is essential for VLSI ICs implemented in nanometer technologies, operating
at high clock speeds. Traditional scan based methodologies can be used for at-speed …

Power dissipation during scan testing of modern high complexity designs could be many
folds higher than the functional operation power, which is a well established observation …

Excessive switching activity in test mode results in higher power dissipation than normal
mode of operation and becoming a serious issue, in order to avoid reliability problems …

Scanning of test vectors during testing causes unnecessary and excessive switching in the
combinational circuit compared to that in the normal operation. In this paper, we propose a …