Grazing exit electron probe microanalysis (GE-EPMA) is a new method of EPMA in which
characteristic X-rays emitted from only near-surface regions of a specimen are detected at …

In conventional electron probe microanalysis (EPMA), the electron-induced X-rays are
measured at large take-off angles of about 45°. In the grazing exit EPMA (GE-EPMA) …

In grazing exit electron probe microanalysis (GE‐EPMA), characteristic x‐rays emitted from
only near surface regions of a specimen are detected at extremely low exit angles near 0° …

We developed a new method of grazing exit electron probe microanalysis (GE-EPMA) and
applied it to analyze both Si surfaces and Mg-salt particles. In conventional EPMA, X-rays …

Ultra-thin metallic films, artificial particles and aerosols were analyzed by grazing-exit
electron probe X-ray microanalysis (GE-EPMA). It is beneficial to measure the characteristic …

Surface analysis was performed by a new analytical method, grazing‐exit electron probe
microanalysis (GE‐EPMA). At grazing‐exit (small x‐ray take‐off) angles, only characteristic x …

We applied the grazing exit electron probe microanalysis (GE-EPMA) to analyses of a
submicrometer precipitate, which consisted of Si and Ni, in a copper base alloy. We …

Each stage in the analysis of inclusions by electron probe microanalysis is evaluated. These
stages include experimental design and instrument operation, specimen preparation …

A new method, grazing-exit electron probe microanalysis (GE-EPMA), was studied. Only X-
rays emitted from the near-surface layer are measured at grazing-exit angles (eg< 0.5°) …

Electron probe microanalysis (or Scanning electron microscope-energy dispersive X-ray
spectrometry) has been studied under grazing-exit conditions. That is, characteristic X-rays …