Since its invention in 1991, Kelvin Probe Force Microscopy (KPFM) has developed into the
primary tool used to characterize electrical phenomena on the nanometer scale, with …

Kelvin probe force microscopy (KPFM) has been used for the characterization of metals,
insulators, and semiconducting materials on the nanometer scale. Especially in …

We analyze Kelvin probe force microscopy (KPFM) for tip-sample systems that contain static
charges by presenting a rigorous derivation for the respective KPFM signal in all common …

Since its inception over two decades ago, Kelvin probe force microscopy (KPFM) has
become the standard technique for characterizing electrostatic, electrochemical and …

In Kelvin Probe Force Microscopy (KPFM) electronic crosstalk can occur between the
excitation signal and probe deflection signal. Here, we demonstrate how a small …

The KPFM signal for systems containing local charges can be expressed as a weighted sum
over all local charges. The weight function for charges quantifies the contribution of each …

Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique,
used to measure surface potential accurately; it has found extensive use in the study of a …

A comprehensive discussion of the physical origins of Kelvin probe force microscopy
(KPFM) signals for charged systems is given. We extend the existing descriptions by …

A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing
photothermal as opposed to electrical excitation is developed. Photothermal band excitation …

A multidimensional scanning probe microscopy approach for quantitative, cross-talk free
mapping of surface electrostatic properties is demonstrated. Open-loop band excitation …