Knowledge on surface potential dynamics is crucial for understanding the performance of
modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin …

Kelvin probe force microscopy (KPFM) has been used for the characterization of metals,
insulators, and semiconducting materials on the nanometer scale. Especially in …

In this study we investigate the influence of the operation method in Kelvin probe force
microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the …

We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface
potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the …

Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for
high resolution measurements of local surface potentials, yet on coarse topographic …

A multidimensional scanning probe microscopy approach for quantitative, cross-talk free
mapping of surface electrostatic properties is demonstrated. Open-loop band excitation …

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure
electric potential on surfaces at nanometer length scales. Here we demonstrate that …

Kelvin probe force microscopy (KPFM) has provided deep insights into the local electronic,
ionic and electrochemical functionalities in a broad range of materials and devices. In …

We demonstrate frequency modulation Kelvin probe force microscopy operated in lift-mode
under ambient conditions. Frequency modulation detection is sensitive to force gradients …

Kelvin probe force microscopy (KPFM), a characterization method that could image surface
potentials of materials at the nanoscale, has extensive applications in characterizing the …