As the size of electronic devices continues to shrink, characterization methods capable of
precisely probing localized properties become increasingly important. Scanning probe …

The invention of scanning tunneling microscopy (STM), rapidly followed by atomic force
microscopy (AFM), occurred at the time when extensive research on sub-µm metal oxide …

We devised a method for the reliable electrical testing of nanoscale wire arrays using
conducting probe atomic force microscopy (AFM) in ambient conditions. A key requirement …

The first book to summarize the applications of CAFM as the most important method in the
study of electronic properties of materials and devices at the nanoscale. To provide a global …

A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …

Atomic force microscopy (AFM) methods utilizing resonant mechanical vibrations of
cantilevers in contact with a sample surface have shown sensitivities as high as few …

A simple method for nanofabricating sensors on cantilever probe tips, used in atomic force
microscopy (AFM), is described. The method uses voltage pulses to evaporate and create a …

Resolution and field-of-view often represent a fundamental tradeoff in microscopy. Atomic
force microscopy (AFM), in which a cantilevered probe deflects under the influence of local …

The availability of very sharp, wear-proof, electrically conductive probes is one crucial issue
for conductive atomic force microscopy (AFM) techniques such as scanning capacitance …

In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …