Radiation susceptibility of electronics has always been about probing electrical properties in
either transient or time-accumulated phenomena. As the size and complexity of electronic …

As electronic systems become larger and more complex, detection of the most vulnerable
regions (MVR) to radiation exposure becomes more difficult and time consuming. We …

The amount of ionizing radiation that semiconductor devices encounter during their lifecycle
degrades both of their functional and electrical parameter performances. Different radiation …

Understanding the single event effects (SEE) sensitivity of microelectronic devices and
circuits is essential for long-term mission success in ionizing radiation environments. SEEs …

An electronic jig has been designed, built, and tested with the purpose of investigating the
radiation susceptibility (RS) of IC components. The problems of RS measurement for …

With the rapid development of semiconductor technology, the reduction in device operating
voltage and threshold voltage has made integrated circuits more susceptible to the effects of …

Semiconductor Radiation Detection Systems addresses the state-of-the-art in the design of
semiconductor detectors and integrated circuit design, in the context of medical imaging …

This ninth biennial Compendium. continues the previous work of Nichols, et al., on single
event effects (SEE) on microcircuits first published in 1985. Because of the volume of SEE …

Research on the effects of radiation on advanced electronic devices and integrated circuits
has experienced rapid growth over the last few years, resulting in many approaches being …

The advances in semiconductor detectors, scintillators, photodetectors such as SiPM, and
readout electronics in the past decades have led to significant progress in terms of …