The ability for Single Event Transients (SETs) to induce soft errors in Integrated Circuits (ICs)
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …

Single event effects (SEE) are a reliability concern for modern microelectronics. Bit
corruptions can be caused by single event upsets (SEUs) in the storage cells or by sampling …

The single event transients (SETs) are a common source of malfunction in nano-scale
CMOS integrated circuits. For this reason, evaluation of the SET effects and application of …

We describe an approach for analyzing single event transients (SETs) in complex digital
circuits. The approach combines accuracy with efficiency: simulation is used for propagating …

The creation of soft errors due to the propagation of single event transients (SETs) is a
significant reliability challenge in modern CMOS logic. SET concerns continue to be …

This paper reviews the status of research in modeling and simulation of single-event effects
(SEE) in digital devices and integrated circuits, with a special emphasis on the current …

An accurate and computer efficient analytical model for the evaluation of integrated circuit
sensitivity to radiation induced single event transients is presented. The key idea of the work …

Heavy ion-induced single events transients (SETs) in advanced digital circuits are becoming
a significant reliability issue for space-based systems. In this work, two experiments are …

Abstract Single Event Transients are considerably more difficult to model, simulate and
analyze than the closely-related Single Event Upsets. The work environment may cause a …

We present the architecture and a detailed pre-fabrication analysis of a digital measurement
ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also …