We apply scanning voltage microscopy to actively biased multiquantum-well ridge-
waveguide semiconductor lasers. We localize the source of a major and hitherto …

In this work, a procedure to determine the spatial resolution in scanning capacitance (SCM)
and scanning spreading resistance microscopy (SSRM) is proposed and demonstrated. It is …

The current state of the art of electrostatic force microscopy (EFM) is presented. The
principles of EFM operation and the interpretation of the obtained local voltage and …

In scanning gate microscopy, where the tip of a scanning force microscope is used as a
movable gate to study electronic transport in nanostructures, the shape and magnitude of …

As the downscaling in semiconductor industry continues, the correct operation of devices
becomes critically dependent on the precise location and activation of the dopants in two …

Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

In microelectronics and biology, many fundamental processes involve the exchange of
charges between small objects, such as nanocrystals in photovoltaic blends or individual …

Conductive atomic-force microscopy (C-AFM), where a conductive, biased probe is scanned
in contact mode across the surface under investigation is one of the most prominent …

A recently developed conductive atomic force microscopy (cAFM) technique, nanoscale
impedance microscopy (NIM), is presented as a characterization strategy for nanoelectronic …

We have combined a home-built capacitance sensor with a commercial scanning force
microscope to obtain a Scanning Capacitance Microscope (SCM). The SCM has been used …