We investigate the dependency of electrostatic interaction forces on applied potentials in
electrostatic force microscopy (EFM) as well as in related local potentiometry techniques …

A scanning force microscope can be used to measure a device's internal electrical potential
with high spatial and temporal resolution. We present experimental results taken with a …

Electron beam induced current (EBIC) and optical beam induced current (OBIC) methods of
scanning microscopy are here described in view of their applications in the analysis of …

We have extended the capabilities of an atomic force microscope (AFM) with double
heterodyne force detection, to include both electrostatic force microscopy (EFM) and …

The dimensions of semiconductor devices rapidly decreasing, the detection and control of
spatial inhomogeneities of material properties on a sub-μm scale becomes essential. For …

A new configuration of conductive atomic force microscope (CAFM) is presented, which is
based in a conventional AFM with a logarithmic current-to-voltage (log IV⁠) amplifier. While …

The combination of atomic force microscopy (AFM) and Kelvin probe technology is a
powerful tool to obtain high-resolution maps of the electric surface potential distribution on …

Scanning probe microscopy methods allow the investigation of a variety of sample surface
properties on a nanometer scale, even down to single molecules. As molecular electronics …

We report on the measurements of two-dimensional potential distribution with nanometer
spatial resolution of operating light-emitting diodes. By measuring the contact potential …

Scanning probe microscopy (SPM) refers to a family of techniques that have become
essential to study many different properties of materials and devices at the nanoscale. All of …