Tip microscopy techniques have become very widely spread methods of scanning imaging
of microstructures or nanostructures in almost any material problem. This applies both to …

In this paper, we report on the integration technique and fabrication of a scanning probe
interrogating the location of charges and their tracks inside quantum devices. Our unique …

Cross-sectional Kelvin probe force microscopy (KPFM) in ultrahigh vacuum is used to
characterize the electronic structure of InGaAs/InP quantum wells. The KPFM signal shows …

Understanding the interplay between the structure, composition and opto-electronic
properties of semiconductor nano-objects requires combining transmission electron …

Multifrequency measurements in atomic force microscopy (AFM) are one of the main
techniques advancing this method. Detection of the AFM probe response at different …

Characterization of novel nanoelectronic structures and materials requires advanced and
high-resolution diagnostic methods. In this article new approach for high sensitivity …

Scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy
(SSRM) are both valuable tools for analyzing the two-dimensional carrier distribution in …

Scanning probe microscopy has emerged as a primary tool for exploring and controlling the
nanoworld. A critical part of scanning probe measurements is the information transfer from …

Using manipulation holders specially designed for transmission electron microscope (TEM),
nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ …

In this study we investigate the influence of the operation method in Kelvin probe force
microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the …