Characterization of electronic properties of nanomaterials usually involves fabricating field
effect transistors and deriving materials properties from device performance measurements …

In this study we investigate the influence of the operation method in Kelvin probe force
microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the …

Cross-sectional Kelvin probe force microscopy (KPFM) in ultrahigh vacuum is used to
characterize the electronic structure of InGaAs/InP quantum wells. The KPFM signal shows …

Scanning surface potential microscopy (SSPM) is one of the most widely used techniques
for the characterization of electrical properties at small dimensions. Applicability of SSPM …

The first book to summarize the applications of CAFM as the most important method in the
study of electronic properties of materials and devices at the nanoscale. To provide a global …

In situ transmission electron microscopy (TEM) technology has become one of the fastest
growing areas in TEM research in recent years. This technique allows researchers to …

The effect of illumination from the laser of an optical-beam-deflection atomic force
microscope (AFM) on a semiconductor sample is monitored with a (connected in parallel) …

The spatial distribution of scanning microscope conduction-mode signals in bulk specimen,
with bias, is predicted by a one-dimensional theory in linear geometry devices. Micrographs …

Kelvin probe force microscopy is a scanning probe method for imaging the surface potential
by atomic force microscopy. The surface potential is one of the most important surface …

This paper describes new developments in the field of nanostructure fabrication and
characterization. On the processing side, problems in the areas of lithography, patterning …