Kelvin probe force microscopy (KPFM) is one of the most promising non-contact electrical
nanometrology techniques to characterize doped semiconductors. By applying a recently …

A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …

Understanding the behavior of complex materials such as organic self-assembled
monolayers, molecular and nano wires, and transition metal oxide thin films, is facilitated by …

The need to resolve the electrical properties of confined structures (CNTs, quantum dots,
nanorods, etc) is becoming increasingly important in the field of electronic and …

Although scanning probe microscopy is traditionally limited to slow temporal response,
techniques utilizing nonlinear tip-to-sample interactions can be used to capture very fast …

Kelvin probe force microscopy (KPFM) should be a key tool for characterizing the device
physics of nanoscale electronics because it can directly image electrostatic potentials. In …

Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic
force microscopy (AFM), has reached nanometre dimensions, necessary to investigate …

In this thesis we investigate Coulomb blockade phenomena and single-electron charging
effects in two nanoscale structures: Long semiconducting carbon nanotubes (CNTs) and …

Electronic conduction pathways in dielectric thin films are explored using automated
experiments in scanning probe microscopy (SPM). Here, we use large field of view scanning …

Detection of dynamic surface displacements associated with local changes in material strain
provides access to a number of phenomena and material properties. Contact resonance …