Detection of dynamic surface displacements associated with local changes in material strain
provides access to a number of phenomena and material properties. Contact resonance …

Electronic conduction pathways in dielectric thin films are explored using automated
experiments in scanning probe microscopy (SPM). Here, we use large field of view scanning …

A numerical analysis of the polarization force between a sharp conducting probe and a
dielectric film of finite lateral dimensions on a metallic substrate is presented with the double …

A multidimensional scanning probe microscopy approach for quantitative, cross-talk free
mapping of surface electrostatic properties is demonstrated. Open-loop band excitation …

A brief explanation of the optoelectronic probe concept and a comparison between the
implementation of passive waveguide probes and optoelectronic probes in scanning near …

In this thesis we investigate Coulomb blockade phenomena and single-electron charging
effects in two nanoscale structures: Long semiconducting carbon nanotubes (CNTs) and …

An electric force microscope employs a charged atomic force microscope probe in vacuum
to measure fluctuating electric forces above the sample surface generated by dynamics of …

Electric potential measurements on different metals and semiconductors have been
performed using a scanning probe microscope. The measured potential shows a clear …

Nanopotentiometry is a scanning probe microscopy (SPM) technique providing insight in the
actual working behavior of semiconductor devices under operation. In nanopotentiometry, a …

Electromechanical response of solids underpins image formation mechanism of several
scanning probe microscopy techniques including the piezoresponse force microscopy …